Inline & Virtual Metrology

Sustainability and competitiveness in automotive, aerospace or transportation manufacturing industries rely on the development of enhanced processes that are continuously increasing their complexity and demands on energy and material efficiency, flexibility and integration.
These industrial sectors are therefore subject to continuous evolution, which sets unique challenges to quality control technology research. To name a few:

  • Introduction of new and improved materials in the manufacturing processes with advanced features and free-form surfaces.
  • Richer knowledge demand about process behaviour and performance.
  • Automation in the production of larger parts with zero-defects; or
  • Provenance of ICT enablers in the manufacturing process.

Inline & virtual metrology research seeks for innovative approaches, which can deliver closer to the manufacturing line, more customised, high-performance, cost-effective, low-uncertainty, time-constrained quality control solutions. Thus, Innovalia Association focuses on the development of the supporting technology leveraging new metrology equipment, tools and methods for large or high-value added part inspection and real-time handling of Metrology Manufacturing Process (M2P®) information.
Innovalia as a pioneer in the foundation of the virtual part and virtual metrology concept and key standardization player in the filed, cooperates with companies in the development of their integrated technology for equipment and process control.
Innovalia Association research addresses the following challenges:

  • Intelligent control devices and in-line metrology systems, embedded in high-performance machines.
  • Equipment for reliable and high-precision in-situ measurement of complex process/product parameters.
  • Software technologies for automated, multi-size, multi-material, free-form, 3D computational metrology solutions.
  • Virtual Measurement Information (VMI) management for real-time, non-destructive, characterisation of dimensions, surfaces and shapes.
  • Wireless communication metrology capabilities.